HF RFID Wet Inlay – PET – Ø25 mm
HF RFID Wet Inlay – PET – Ø25 mm · HF · PET · 25 mm.
PRODUCT FORMATRFID InlayProduct format listing. Configuration confirmed during quote review.
PRODUCT DOCUMENT
Locally processed file. Confirm the selected configuration against the current datasheet before ordering.As low as · 5,000 pieces$0.13Per unit, at the largest published order quantity · minimum order 100 pieces · confirmed at quote Datasheet
QUANTITY LADDER · PER-UNIT PLANNING REFERENCE
| Order quantity | Unit price |
|---|---|
| 100 pieces | $0.26 |
| 500 pieces | $0.19 |
| 1,000 pieces | $0.17 |
| 5,000 pieces | $0.13 |
Use this rfid inlay listing to compare format, construction and size. Validate the item, attachment, read boundary and destination configuration before purchase.
PRODUCT DETAILS
Product summary
- Product format
- RFID Inlay
- SKU
- Confirm during quote review
- Frequency
- HF
- Construction
- PET
- Size
- Ø22 mm
- Documentation
- Local product document available
Identification and construction
- Chip Type
- NXP ICODE SLIX
- Protocol
- ISO/IEC 15693, ISO/IEC 18000-3, NFC Forum Type 5 Tag
- Core ID
- 3 inch (76.2 ± 0.50 mm)
- Surface
- Paper carton, plastic, wood
- Mounting Method
- Stick
Electrical and memory
- EEPROM
- 1024 bits, organized in 32 blocks of 4 bytes each
- Security Features
- Unchangeable 64-bit UID / Password-protected EAS and
Environment
- Operating Environment
- -40°C~+70°C, 20%~90% RH
- Storage Environment
- +18°C~+28°C, 40%~60% RH
Packing and customization
- Packing Quantity
- 2500 Pcs/roll, per roll 0.64 kg
01 / PRODUCT FAQ
Ask for the
right detail.
No. Confirm the exact construction, quantity, destination, region, availability, delivery, warranty and support path before ordering.
The shown figure is a per-unit planning reference derived from the published quantity ladder. The exact unit price, configuration and commercial terms are confirmed at quote review.
02 / NEXT STEP
Request a quote,
sample or expert review.
Share the item and operating context. We will confirm the configuration, availability and sensible test path.